teasystems.com - TEA Systems - Semiconductor Data modeling for process control and characterization

home > domains > teasystems.com

Description: TEA Systems software for semiconductor process and tool modeling and control using adaptive models.

validation (288) opc (208) qualification (149) ret (27) eol (25) end-of-line (21) phase shift (4) meef (3) reticle enhancement (1)

Example domain paragraphs

Semiconductor data modeling for reticle, tool, process and yield AntiSpam About TEA  |  Introducing TEA (Presentations)  |  Services  |  Publications  |  Classes  |  Contact   [  Products  ] [  News  ] [  Product Overviews  ] [  Brochures  ]   Video Tutorials: Vector Raptor  /  Best Focus Free Analysis Request IC Photomask c1974 Emulsion on 8 x 10 x 0.25 inch Glass Plate

Double-Pattern Vector Rotation/Magnification, BARC and Feature-Profile Uniformity Comparative & Difference Matching Tools ..... VR Matching tm A new and unique concept in data analysis for Overlay, Focus, CD, Film Thickness etc. with a simplified approach to Performance Matching, Process Window Extrapolation, Tool Matching, Reticle Haze detection, DFM Validation and Yield Enhancement TEA Systems

Semiconductor Process Characterization and Control Software

Links to teasystems.com (1)

• alburtispark.net Alburtis Park Country Music, Bingo & PA Dutch Cooking