Description: Best In Class AFM Tips. Decade by Decade, Wafer by Wafer, AFM Probe by AFM Probe.
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google_plus linkedin twitter youtube search Nanosensors logo Product search R&D AFM Probes Series Quick Selection Table Brochures AFM Tips How to buy R&D History About Blog Research driven excellence since 1990! We are providing the most consistent AFM probe quality, year by year, batch by batch, wafer by wafer, probe by probe and we are constantly working on new and improved products. [more]
In this application image we used the small cantilever of the NANOSENSORS™ uniqprobe® BioT to scan in ScanAsyst®* mode in air. We imaged crystallites with nanometer-sized edge features with a scan size of 1 µm and a speed of 2 µm/s. Even in a that large, micrometer size image of a surface with a distinct topography, feature sizes of 5 nm and below are clearly visible. [more]
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