Description: LayTec is a major provider of integrated metrology for thin-film deposition and other high value generating processes. LayTec’s equipment is used in a broad range of applications like optoelectronics, electronics, PV, displays, optics and photonics, SEMI and flash memory production, automotive industry and others. Customer's benefits: fab-wide optimization of processes and film quality, better production efficiency, higher yields and lower costs.
process optimization (80) thin-film deposition (17) in-line metrology (7) integrated metrology (5) in-situ metrology (5) lab-line metrology (5) map-line metrology (5) real-time process monitoring (5) epitaxial process optimization (5) yield improvement (5)
In-situ monitoring of 2D materials epitaxy during chemical vapor deposition Data Sheet EpiX C2C Optimizing epitaxial layer uniformity by combining in-situ and ex-situ metrology Discontinuation of NI PCIe 6025 software support LayTec to supply two InspiRe systems for in-situ monitoring of perovskite formation to Helmholtz Innovation Lab HySPRINT at Helmholtz-Zentrum Berlin In-line thickness monitoring during R2R OLED and OPV manufacturing
Benefits of integrated metrology
Quick identification of process deviations Optimization of thin-film quality Enhancement of production efficiency and yield Fast transfer of established processes Fast track to new materials and processes