Description: Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers
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PHE100 Spectroscopic Reflectometer Simple, accurate, reliable, affordable desktop or in-situ/on-line, R&D or production Thickness and optical constants (n and k) can be measured quickly and easily. The measurement and analysis of the data provides results in seconds. Ellipsometer Thickness Range: 20 nm to 50000 nm PHE101 Discrete Wavelength Ellipsometer The PHE101 is an ideal discrete wavelength ellipsometer designed for measuring the refractive index and thickness of single and multi-layer films. The PHE10
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